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@INPROCEEDINGS{Abella2007,
  author = {Abella, J. and Vera, X. and Gonzalez, A.},
  title = {Penelope: The NBTI-Aware Processor},
  booktitle = {MICRO},
  year = {2007},
}

@INPROCEEDINGS{Bhardwaj2006,
  author = {Bhardwaj, S. and \emph{et al.}},
  title = {Predictive Modeling of the {NBTI} Effect for Reliable Design},
  booktitle = {CICC},
  year = {2006},
}

@INPROCEEDINGS{Kang2007,
  author = {K. Kang and Kufluoglu, H. and Alain, M. A. and Roy, K. },
  title = {Efficient Transistor-Level Sizing Technique under Temporal Performance
	Degradation due to {NBTI}},
  booktitle = {ICCD},
  year = {2007},
}

@INPROCEEDINGS{Kumar2007,
  author = {Kumar, S. V. and Kim, C. H. and Sapatnekar, S. S.},
  title = {{NBTI}-Aware Synthesis of Digital Circuits},
  booktitle = {DAC},
  year = {2007},
}

@INPROCEEDINGS{Kumar2006,
  author = {Kumar, S. V. and Kim, C. H. and Sapatnekar, S. S.},
  title = {An Analytical Model for Negative Bias Temperature Instability},
  booktitle = {ICCAD},
  year = {2006},
}

@INPROCEEDINGS{Stempkovsky2009,
  author = {Stempkovsky, A. and Glebov, A. and Gavrilov, S.},
  title = {Calculation of stress probability for {NBTI}-aware timing analysis},
  booktitle = {ISQED},
  year = {2009},
}

@INPROCEEDINGS{Sun2009,
  author = {Sun, J. and Kodi, A. and Louri, A. and Wang, J. M.},
  title = {{NBTI} aware workload balancing in multi-core systems},
  booktitle = {ISQED},
  year = {2009},
}

@INPROCEEDINGS{Vaidyanathan2009,
  author = {Vaidyanathan, B. and Oates, A. S. and Y. Xie and Y. Wang},
  title = {{NBTI}-aware statistical circuit delay assessment},
  booktitle = {ISQED},
  year = {2009},
}

@INPROCEEDINGS{Vattikonda2006,
  author = {Vattikonda, R. and W. Wang and Y. Cao},
  title = {Modeling and minimization of {PMOS} {NBTI} effect for robust nanometer
	design},
  booktitle = {DAC},
  year = {2006},
 }

@INPROCEEDINGS{Wang2008,
  author = {W. Wang and S. Yang and Y. Cao},
  title = {Node Criticality Computation for Circuit Timing Analysis and Optimization
	under {NBTI} Effect},
  booktitle = {ISQED},
  year = {2008},
}

@INPROCEEDINGS{Wang2009,
  author = {Y. Wang and X. Chen and W. Wang and Y. Cao and Y. Xie and H. Yang},
  title = {Gate replacement techniques for simultaneous leakage and aging optimization},
  booktitle = {DATE},
  year = {2009},
}

@INPROCEEDINGS{Wang2007,
  author = {Y. Wang and \emph{et al.}},
  title = {Temperature-aware {NBTI} modeling and the impact of input vector control
	on performance degradation},
  booktitle = {DATE},
  year = {2007},
}

@INPROCEEDINGS{Yang2007,
  author = {X. Yang and Saluja, K. },
  title = {Combating {NBTI} Degradation via Gate Sizing},
  booktitle = {ISQED},
  year = {2007},
}

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@inproceedings{Zhang09,
 author = {Zhang, L. and Dick, R. P.},
 title = {Scheduled voltage scaling for increasing lifetime in the presence of {NBTI}},
 booktitle = {ASPDAC},
 year = {2009},
 }

 @inproceedings{Tiwari08,
 author = {Tiwari, A. and Torrellas, J.},
 title = {Facelift: Hiding and slowing down aging in multicores},
 booktitle = {MICRO},
 year = {2008},
 }

@inproceedings{Kumar09,
 author = {Kumar, S. and Kim, C. and Sapatnekar, S.},
 title = {Adaptive techniques for overcoming performance degradation due to aging in digital circuits},
 booktitle = {ASPDAC},
 year = {2009},
}

@inproceedings{Chen09,
 author = {X. Chen and \emph{et al.}},
 title = {Variation-Aware Supply Voltage Assignment for Minimizing Circuit Degradation and Leakage},
 booktitle = {ISLPED},
 year = {2009},
}

@inproceedings{Sundararajan99,
 author = {Sundararajan, V. and Parhi, K. K.},
 title = {Low power synthesis of dual threshold voltage {CMOS} {VLSI} circuits},
 booktitle = {ISLPED},
 year = {1999},
}

@inproceedings{Huard06,
 author = {V. Huard and M. Denais and C. Parthasarathy},
 title = {{NBTI} degradation: From physical mechanisms to modeling},
 booktitle = {Microelectron. Reliab.},
 year = {2006},
}
